@article {staudacher_09_selbstadaptivitaet,
	title = {Self Adjustment of Scanning Electron Microscopes / Selbstadaptivit{\"a}t von Rasterelektronenmikroskopen},
	journal = {Patent, Patent Number  WO2009062781A1},
	year = {2009},
	author = {Staudacher, M. and Fred A. Hamprecht and G{\"o}rlitz, L.}
}
@booklet {goerlitz_07_schnelle,
	title = {Schnelle 3D-Vermessung von Partikeln in Rasterelektronenmiskroskopen mit Hilfe eines R{\"u}cksteuerdetektors},
	year = {2007},
	author = {G{\"o}rlitz, L. and Singh, M. and Sch{\"u}tzbach, P.}
}
@conference {goerlitz_07_semi,
	title = {Semi-Supervised Tumor Detection in MRSI With Discriminative Random Fields},
	booktitle = {Pattern Recognition},
	volume = {4713},
	year = {2007},
	note = {1},
	pages = {224-233},
	publisher = {Springer},
	organization = {Springer},
	doi = {10.1007/978-3-540-74936-3_23},
	author = {G{\"o}rlitz, L. and Bjoern H. Menze and M.-A. Weber and B. Michael Kelm},
	editor = {Fred A. Hamprecht and Fred A. Hamprecht and Christoph Schn{\"o}rr and Bernd J{\"a}hne}
}
