H.  Eisele and Hamprecht, F. A., ?A new approach for defect detection in X-ray CT images?, Pattern Recognition, vol. 2449. Springer, pp. 345-352, 2003.

H.  Spies and Garbe, C. S., ?Dense parameter fields from total least squares?, in Proceedings of the 24th DAGM Symposium on Pattern Recognition, 2002, vol. LNCS 2449, p. 379--386.

C. S.  Garbe, Spies, H., and Jähne, B., ?Mixed OLS-TLS for the estimation of dynamic processes with a linear source term?, in Proceedings of the 24th DAGM Symposium on Pattern Recognition, 2002, vol. 2449, p. 463--471.