A.  Sanakoyeu, Tschernezki, V., Büchler, U., and Ommer, B., ?Divide and Conquer the Embedding Space for Metric Learning?,  Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR). 2019.

A.  Sanakoyeu, Kotovenko, D., Lang, S., and Ommer, B., ?A Style-Aware Content Loss for Real-time HD Style Transfer?, in Proceedings of the European Conference on Computer Vision (ECCV) (Oral), 2018.