Publications

Export 8 results:
Author Title Type [ Year(Desc)]
Filters: Author is Gelautz, Margrit  [Clear All Filters]
2008
C. Rhemann, Rother, C., and Gelautz, M., Improving color modeling for alpha matting, in BMVC 2008 - Proceedings of the British Machine Vision Conference 2008, 2008.
2009
C. Rhemann, Rother, C., Wang, J., Gelautz, M., Kohli, P., and Rott, P., A perceptually motivated online benchmark for image matting, in 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2009, 2009, vol. 2009 IEEE, pp. 1826–1833.
C. Rhemann, Rother, C., Wang, J., Gelautz, M., Kohli, P., and Rott, P., A perceptually motivated online benchmark for image matting, in 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2009, 2009, vol. 2009 IEEE, pp. 1826–1833.
C. Rhemann, Rother, C., Wang, J., Gelautz, M., Kohli, P., and Rott, P., A perceptually motivated online benchmark for image matting, in 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2009, 2009, vol. 2009 IEEE, pp. 1826–1833.
M. Bleyer, Gelautz, M., Rother, C., and Rhemann, C., A stereo approach that handles the matting problem via imagewarping, in 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2009, 2009, vol. 2009 IEEE, pp. 501–508.
2010
C. Rhemann, Rother, C., Kohli, P., and Gelautz, M., A spatially varying PSF-based prior for alpha matting, in Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2010, pp. 2149–2156.
2013
M. Hornáček, Rhemann, C., Gelautz, M., and Rother, C., Depth super resolution by rigid body self-similarity in 3D, in Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2013, pp. 1123–1130.
A. Hosni, Rhemann, C., Bleyer, M., Rother, C., and Gelautz, M., Fast cost-volume filtering for visual correspondence and beyond, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 35, pp. 504–511, 2013.