| Title | MIC: Mining Interclass Characteristics for Improved Metric Learning |
| Publication Type | Conference Paper |
| Year of Publication | 2019 |
| Authors | Brattoli, B, Roth, K, Ommer, B |
| Conference Name | Proceedings of the Intl. Conf. on Computer Vision (ICCV) |
| Citation Key | 6321 |
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