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2003

H. Eisele and Hamprecht, F. A., “A new approach for defect detection in X-ray CT images”, Pattern Recognition, vol. 2449. Springer, pp. 345-352, 2003.

Technical Report (398.88 KB)

2002

H. Spies and Garbe, C. S., “Dense parameter fields from total least squares”, in Proceedings of the 24th DAGM Symposium on Pattern Recognition, 2002, vol. LNCS 2449, p. 379--386.

C. S. Garbe, Spies, H., and Jähne, B., “Mixed OLS-TLS for the estimation of dynamic processes with a linear source term”, in Proceedings of the 24th DAGM Symposium on Pattern Recognition, 2002, vol. 2449, p. 463--471.