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Publications

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Author Title Type [ Year(Asc)]
Filters: Author is Tschernezki, V.  [Clear All Filters]
2021
A. Sanakoyeu, Ma, P., Tschernezki, V., and Ommer, B., “Improving Deep Metric Learning by Divide and Conquer”, IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 2021.
2019
A. Sanakoyeu, Tschernezki, V., Büchler, U., and Ommer, B., “Divide and Conquer the Embedding Space for Metric Learning”, Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR). 2019.